恒溫(wen)(wen)恒濕(shi)試驗(yan)箱的(de)溫(wen)(wen)度偏差(cha)怎么(me)校準?

     恒(heng)(heng)溫(wen)恒(heng)(heng)濕試(shi)驗箱(xiang)(xiang)（高低(di)溫(wen)交(jiao)(jiao)變濕熱(re)試(shi)驗箱(xiang)(xiang)）適用于工(gong)業(ye)產品高低(di)溫(wen)，交(jiao)(jiao)變濕熱(re)，恒(heng)(heng)溫(wen)恒(heng)(heng)濕的可靠性試(shi)驗，KW-TH系(xi)列恒(heng)(heng)溫(wen)恒(heng)(heng)濕箱(xiang)(xiang)是(shi)對電(dian)子電(dian)工(gong)、零(ling)部件、汽車摩托、光(guang)電(dian)光(guang)纖、通(tong)訊器(qi)件、半導(dao)體、照(zhao)明(ming)電(dian)器(qi)、LED光(guang)電(dian)、復合材料、高分子材料、模具五金、LCD液(ye)晶(jing)顯示(shi)屏、航空航天、船舶bing器(qi)、高(gao)等院校、科研(yan)單(dan)位(wei)等相(xiang)關產(chan)品的(de)零部件及(ji)材料在高(gao)、低溫(wen)交變(bian)循環變(bian)化的(de)情況下，檢驗其各項(xiang)性能指標。

     恒溫(wen)(wen)(wen)(wen)(wen)濕熱(re)試驗箱在高(gao)溫(wen)(wen)(wen)(wen)(wen)及(ji)低溫(wen)(wen)(wen)(wen)(wen)時的溫(wen)(wen)(wen)(wen)(wen)度均勻(yun)度應不(bu)能大(da)于(yu)(yu)2.0℃。高(gao)低溫(wen)(wen)(wen)(wen)(wen)濕熱(re)試驗箱的溫(wen)(wen)(wen)(wen)(wen)度波動度高(gao)溫(wen)(wen)(wen)(wen)(wen)時不(bu)大(da)于(yu)(yu)0.5℃；低溫(wen)(wen)(wen)(wen)(wen)時不(bu)大(da)于(yu)(yu)1.0℃。

    高低溫濕熱試(shi)驗箱，恒溫恒濕試(shi)驗箱工作室內壁溫度(du)與(yu)工作空間溫度(du)的差距：

    可(ke)程式恒溫(wen)(wen)(wen)(wen)(wen)(wen)恒濕(shi)試驗(yan)(yan)箱(xiang)工(gong)作室內壁溫(wen)(wen)(wen)(wen)(wen)(wen)度(du)(du)與工(gong)作空間(jian)溫(wen)(wen)(wen)(wen)(wen)(wen)度(du)(du)之差，高(gao)(gao)(gao)低(di)溫(wen)(wen)(wen)(wen)(wen)(wen)交變濕(shi)熱試驗(yan)(yan)箱(xiang)在(zai)高(gao)(gao)(gao)溫(wen)(wen)(wen)(wen)(wen)(wen)下應不(bu)(bu)大(da)于(yu)試驗(yan)(yan)箱(xiang)溫(wen)(wen)(wen)(wen)(wen)(wen)度(du)(du)的(de)(de)(de)3％,在(zai)低(di)溫(wen)(wen)(wen)(wen)(wen)(wen)下應不(bu)(bu)超(chao)過8％。試驗(yan)(yan)箱(xiang)升溫(wen)(wen)(wen)(wen)(wen)(wen)及(ji)降溫(wen)(wen)(wen)(wen)(wen)(wen)速率。在(zai)滿載條件(jian)下，每5min的(de)(de)(de)平(ping)均升溫(wen)(wen)(wen)(wen)(wen)(wen)和降溫(wen)(wen)(wen)(wen)(wen)(wen)速率等級(ji)為(wei)：不(bu)(bu)大(da)于(yu)1℃/min、0.2℃/min、0.6℃/min、1℃/min。濕(shi)度(du)(du):在(zai)高(gao)(gao)(gao)溫(wen)(wen)(wen)(wen)(wen)(wen)條件(jian)下，工(gong)作空間(jian)內的(de)(de)(de)濕(shi)度(du)(du)應不(bu)(bu)大(da)于(yu)20gm3（相(xiang)當于(yu)35℃時，相(xiang)對濕(shi)度(du)(du)為(wei)50％）。高(gao)(gao)(gao)低(di)溫(wen)(wen)(wen)(wen)(wen)(wen)試驗(yan)(yan)箱(xiang)的(de)(de)(de)高(gao)(gao)(gao)溫(wen)(wen)(wen)(wen)(wen)(wen)溫(wen)(wen)(wen)(wen)(wen)(wen)度(du)(du)等級(ji)為(wei)：30，40，55，70，85，100，125，155，175，200℃.（高(gao)(gao)(gao)溫(wen)(wen)(wen)(wen)(wen)(wen)溫(wen)(wen)(wen)(wen)(wen)(wen)度(du)(du)偏(pian)差不(bu)(bu)大(da)于(yu)正負2℃）高(gao)(gao)(gao)低(di)溫(wen)(wen)(wen)(wen)(wen)(wen)試驗(yan)(yan)箱(xiang)的(de)(de)(de)低(di)溫(wen)(wen)(wen)(wen)(wen)(wen)溫(wen)(wen)(wen)(wen)(wen)(wen)度(du)(du)等級(ji)為(wei)： 5，-5，-10，-25，-40，-55，-65℃。（低(di)溫(wen)(wen)(wen)(wen)(wen)(wen)溫(wen)(wen)(wen)(wen)(wen)(wen)度(du)(du)偏(pian)差不(bu)(bu)大(da)于(yu)正負3℃）

恒溫恒濕試驗(yan)箱的溫度是(shi)怎么校準?

    恒溫恒濕(shi)試(shi)驗(yan)(yan)箱的溫度校準(zhun)有(you)以下(xia)(xia)方法，在實際工(gong)作(zuo)中需(xu)要根據實際情(qing)況選(xuan)擇zui合適的方法，下(xia)(xia)面我東莞科(ke)文(wen)試(shi)驗(yan)(yan)設備儀器公司便(bian)對這幾種(zhong)校準(zhun)方法的優缺點進行介紹。

一、在無負載(zai)條件(jian)下(xia)開(kai)展(zhan)校(xiao)準(zhun)：此方法的優(you)點是：高(gao)低溫(wen)試(shi)驗(yan)(yan)(yan)箱(xiang)的整個工作區域都得到了(le)校(xiao)準(zhun)、測試(shi)樣(yang)品變得更時不(bu)需(xu)要(yao)重(zhong)新(xin)校(xiao)準(zhun)、能(neng)夠對高(gao)低溫(wen)試(shi)驗(yan)(yan)(yan)箱(xiang)的適用性做(zuo)出有效(xiao)的評(ping)估(gu)。而它(ta)的主要(yao)缺點是：不(bu)能(neng)評(ping)估(gu)測試(shi)樣(yang)品對試(shi)驗(yan)(yan)(yan)箱(xiang)所造成的影響。

二(er)、在有(you)負載條(tiao)件下開(kai)展校(xiao)準(zhun)：此方法的優點(dian)是：能夠比(bi)較準(zhun)確地(di)評估(gu)測試樣品對試驗箱性能的影響、易于得到測試樣品關鍵部(bu)件或(huo)部(bu)位的環境試驗的詳細信息。而(er)它的主要(yao)缺點(dian)是：當更(geng)換(huan)測試樣品時，需要(yao)重(zhong)新校(xiao)準(zhun)。

三(san)、在使(shi)(shi)用(yong)過程中的(de)(de)(de)實時(shi)測量：此方法(fa)不(bu)僅具(ju)有(you)1和(he)2所述(shu)的(de)(de)(de)方法(fa)具(ju)有(you)的(de)(de)(de)優點(dian)，而且能(neng)夠(gou)得到(dao)測試(shi)樣(yang)品在環境試(shi)驗過程中全(quan)面的(de)(de)(de)環境參數，往往在對環境要(yao)求(qiu)很(hen)高的(de)(de)(de)產(chan)品試(shi)驗時(shi)采(cai)用(yong)。它(ta)的(de)(de)(de)主(zhu)要(yao)缺點(dian)是：每次環境試(shi)驗都需要(yao)使(shi)(shi)用(yong)測量設(she)備，通常(chang)在試(shi)驗箱校準(zhun)時(shi)采(cai)用(yong)無負載條(tiao)件下的(de)(de)(de)校準(zhun)方法(fa)，本文為了便于評估試(shi)驗箱的(de)(de)(de)溫度性能(neng)，也采(cai)用(yong)了此方法(fa)進行分(fen)析。